A Methodology to deal with Electrical Overstress in the Design, Handling and Application of Integrated Circuits
نویسندگان
چکیده
In order to avoid electrical overstress (EOS) fails right from the beginning of the design process, a pro-active methodology is proposed that accounts for the special characteristics of integrated circuits (ICs) and their applications in order to deal with EOS in the design, handling and application of ICs. Zusammenfassung – Zur frühzeitigen Vermeidung von EOS-Ausfällen wird eine pro-aktive Methode zum Umgang mit EOS bei der Entwicklung, Handhabung und Anwendung von integrierten Schaltungen (ICs) vorgeschlagen, wobei die besonderen Eigenschaften von ICs und ihren Anwendungen berücksichtigt werden.
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